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Fabrication of superconducting through-silicon vias

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arxiv 2103.08536 v1 pith:J2RTS4IB submitted 2021-03-15 quant-ph cond-mat.supr-conphysics.app-ph

classification quant-phcond-mat.supr-conphysics.app-ph
keywords superconductingtsvsquantumsystemscriticalhighhigh-aspect-ratiointegration
verification ladder T0 review T1 audit T2 compute T3 formal
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abstract

Increasing circuit complexity within quantum systems based on superconducting qubits necessitates high connectivity while retaining qubit coherence. Classical micro-electronic systems have addressed interconnect density challenges by using 3D integration with interposers containing through-silicon vias (TSVs), but extending these integration techniques to superconducting quantum systems is challenging. Here, we discuss our approach for realizing high-aspect-ratio superconducting TSVs\textemdash 10 $\mu$m wide by 20 $\mu$m long by 200 $\mu$m deep\textemdash with densities of 100 electrically isolated TSVs per square millimeter. We characterize the DC and microwave performance of superconducting TSVs at cryogenic temperatures and demonstrate superconducting critical currents greater than 20 mA. These high-aspect-ratio, high critical current superconducting TSVs will enable high-density vertical signal routing within superconducting quantum processors.

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Cited by 6 Pith papers

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