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A Survey of Self-Supervised and Few-Shot Object Detection

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arxiv 2110.14711 v3 pith:WBP6PRI2 submitted 2021-10-27 cs.CV cs.AIcs.LG

classification cs.CVcs.AIcs.LG
keywords objectdetectionfew-shotself-superviseddataclasseslabelingresearch
verification ladder T0 review T1 audit T2 compute T3 formal
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Labeling data is often expensive and time-consuming, especially for tasks such as object detection and instance segmentation, which require dense labeling of the image. While few-shot object detection is about training a model on novel (unseen) object classes with little data, it still requires prior training on many labeled examples of base (seen) classes. On the other hand, self-supervised methods aim at learning representations from unlabeled data which transfer well to downstream tasks such as object detection. Combining few-shot and self-supervised object detection is a promising research direction. In this survey, we review and characterize the most recent approaches on few-shot and self-supervised object detection. Then, we give our main takeaways and discuss future research directions. Project page at https://gabrielhuang.github.io/fsod-survey/

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    A U-Net trained on CAD layouts and flawed wafer photos can generate defect-free synthetic wafer images that serve as a template for automated defect detection in InP multi-project wafer manufacturing.

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