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Challenging Forgets: Unveiling the Worst-Case Forget Sets in Machine Unlearning

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arxiv 2403.07362 v4 pith:55L3WIOL submitted 2024-03-12 cs.LG cs.AIcs.CV

classification cs.LGcs.AIcs.CV
keywords unlearningdatainfluenceworst-caseerasuremachinemodelmodels
verification ladder T0 review T1 audit T2 compute T3 formal
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The trustworthy machine learning (ML) community is increasingly recognizing the crucial need for models capable of selectively 'unlearning' data points after training. This leads to the problem of machine unlearning (MU), aiming to eliminate the influence of chosen data points on model performance, while still maintaining the model's utility post-unlearning. Despite various MU methods for data influence erasure, evaluations have largely focused on random data forgetting, ignoring the vital inquiry into which subset should be chosen to truly gauge the authenticity of unlearning performance. To tackle this issue, we introduce a new evaluative angle for MU from an adversarial viewpoint. We propose identifying the data subset that presents the most significant challenge for influence erasure, i.e., pinpointing the worst-case forget set. Utilizing a bi-level optimization principle, we amplify unlearning challenges at the upper optimization level to emulate worst-case scenarios, while simultaneously engaging in standard training and unlearning at the lower level, achieving a balance between data influence erasure and model utility. Our proposal offers a worst-case evaluation of MU's resilience and effectiveness. Through extensive experiments across different datasets (including CIFAR-10, 100, CelebA, Tiny ImageNet, and ImageNet) and models (including both image classifiers and generative models), we expose critical pros and cons in existing (approximate) unlearning strategies. Our results illuminate the complex challenges of MU in practice, guiding the future development of more accurate and robust unlearning algorithms. The code is available at https://github.com/OPTML-Group/Unlearn-WorstCase.

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Cited by 3 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. A Mechanistic Perspective and Circuit-Guided Difficulty Metric for Unlearning

    cs.LG 2026-01 conditional novelty 6.0 of 10

    A circuit-similarity score predicts which samples an LLM unlearning method will fail to erase, with hard samples relying on deeper, output-facing pathways.

  2. LoReUn: Data Itself Implicitly Provides Cues to Improve Machine Unlearning

    cs.LG 2025-07 conditional novelty 6.0 of 10

    LoReUn, a plug-in loss-based reweighting strategy, improves approximate machine unlearning by focusing updates on hard-to-forget low-loss data points.

  3. Towards Lifecycle Unlearning Commitment Management: Measuring Sample-level Unlearning Completeness

    cs.LG 2025-06 conditional novelty 6.0 of 10

    IAM interpolates between an original model and a shadow model to score each sample's unlearning completeness, achieving top AUC for exact unlearning and top correlation for approximate unlearning, and exposing under- ...

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